For an enhanced understanding of ongoing Atomic Force Microscopy (AFM) measurements, I have been working on the numerical modeling of the AFM tip (5nm) interacting with a flat substrate immersed in an ionic solution. We investigated the electrical double layer (EDL) overlap with different separation distances for various pH and salt ions concentrations. In contrast from existing studies assuming constant surface charge properties, our results demonstrate that the surface charges of the interacting objects is dependent on the local liquid environment and their separation distance.
- Barisik M, Atalay S, Qian S, Beskok A (2014) Size dependent surface charge properties of silica nanoparticles. Journal of Physical Chemistry C, 118(4):1836–1842,doi:10.1021/jp410536n
- Atalay S, Barisik M, Qian S, Beskok A (2014) Surface Charge of a Nanoparticle Interacting with a Flat Substrate,Journal of Physical Chemistry C, 118(4):1836–1842, doi:10.1021/jp5023554.